Electrical

The measurement of the capacitance of a device.

The process of measuring the Electrical Conductance of a device.

The process measures the AC Current sourced by a device without knowing the shape of the signal. Values can only be tested in RMS because the shape of the signal is unknown.

The process measures the AC Current sourced by a device without knowing the shape of the signal is a sinewave. Knowing the shape of the waveform allows the system to make conversions from RMS to PeakToPeak.

The process measures the Squarewave Current sourced by a device with the assumption it is generating an AC Squarewave. Knowing the shape of the waveform allows the system to make conversions from RMS to PeakToPeak.

The process measures the Alternating Current sourced by a device with the assumption it is generating an AC Trianglewave. Knowing the shape of the waveform allows the system to make conversions from RMS to PeakToPeak.

The process measures the Direct Current (or DC) sourced by a device.

The process of measuring the frequency of a signal.

The process of measuring the demodulated frequency rate of an Amplitude Modulate (AM) signal.

This process measures the Deviation Frequency of a Frequency Modulated (FM) signal. The deviation is used to describe the maximum difference between an FM modulated frequency and the nominal carrier frequency

The process of measuring the Demodulated Rate of a Frequency Modulated (FM) Signal.

The process of measuring the demodulated frequency rate of a phase-modulated RF signal.

The process of measuring the impedance of a device.

The process of measuring the Inductance of a device.

A test process of measuring power spectral density offset from the carrier as compared to the carried power.

The process of measuring the phase-modulated component of a phase-modulated RF signal typically in radians.

The process of measuring the Reflection Coefficient Phase of an RF signal that is reflected back to the transmitting port.

The process of measuring the Transmission Coefficient Phase of an RF signal that transmitted through the device under test.

A test process that measures the RF power of a signal. It can be either direct or monitored by an RF Power measurement device

The process of measuring the Percent of Modulation of an Amplitude Modulation (AM) Signal.

The process of measuring the Reflection Coefficient magnitude of an RF signal that is reflected back to the transmitting port.

A test process that measures the difference between 2 sinusoidal RF signals at different frequencies while keeping the power levels constant. The two measured values are compared, the results can be expressed as dB or percent of change. These two signals are often used when calibrating flatness of a signal generator or similar device.

A test process that measures the difference 2 sinusoidal RF signals at different power levels keeping the frequency constant. The two measured values are compared, the results can be expressed as Delta dB or percent of change. These two signals are often used when calibrating the linearity of a device.

The process of measuring the Transmission Coefficient magnitude of an RF signal that transmitted through the device under test. It is represented as a ratio of power received over the transmitted power.

A test process that measures the ratio between the AC ripple & noise in RMS voltage measured on a DC signal then divided by the DC voltage level creating a ratio between the two voltages.

A test process that measures the amplitude-response difference between two sinusoidal AC sinewave signals at different frequencies while keeping the source voltage level constant. The two measured values are compared, the results can be expressed as (e.g.) straight ratio, dB or percent of change. These two signals are often used when calibrating flatness of a device.

A test process that measures the difference between sinusoidal AC sinewave signals at different voltage levels keeping the frequency constant. The two measured values are compared, the results can be expressed (e.g.) as a voltage ratio, dB or percent of change. These two signals are often used when calibrating linearity of a device.

The process of measuring the resistance of a resister or other device.

The process of measuring the pulse transition time of a square wave signal. The transition can be either be in a positive direction (Risetime) or a negative direction (Fall time).

The process measures the AC RMS (Root-Mean-Square) voltage sourced by the UUT. Values can only be expressed in RMS because the shape of the signal is no known.

A test process that measures the RMS AC voltage ripple or noise on a DC signal.

The process measures the AC RMS (Root-Mean-Square) voltage sourced by the UUT. Because the shape is known the values can be converted to Volts PeakToPeak.

The process measures the AC RMS (Root-Mean-Square) voltage sourced by the UUT. Because the shape is known the values can be converted to Volts PeakToPeak.

This test process measures the DC (Direct Current) voltage sourced from the UUT.

This is the process of generating a known capacitance.

The process of sourcing Electrical Conductance either from a fixed device or simulated.

The process of sourcing Electrical Conductivity either from a fixed device or simulated.

The process of sourcing a Direct Current) voltage from a device and measuring the value on the UUT.

The process of sourcing a Sinusoidal Alternating Current signal. Knowing the shape of the waveform allows the system to make conversions from RMS to PeakToPeak.

The process of sourcing a Squarewave Alternating Current signal. Knowing the shape of the waveform allows the system to make conversions from RMS to PeakToPeak.

The process of sourcing a Triangle Alternating Current signal. Knowing the shape of the waveform allows the system to make conversions from RMS to PeakToPeak.

The process of generating a frequency-stable sinewave waveform.

The process of generating a frequency-stable square waveform.

The process of generating a frequency-stable RF Sinewave waveform.

The process of measuring the impedance of a device.

The process of sourcing electrical Inductance of a device either fixed or simulated.

The process of sourcing a sinusoidal AC Power signal from a device and measuring the value on the UUT. This test process can be used by any device that measures absolute AC power.

The process of sourcing a sinusoidal AC Power signal from a device where the Volts and Amps are provided on two different outputs and measured by the UUT as Watts / Power. This test process can be used by any device that measures AC power with separate voltage and current inputs.

The process of sourcing DC Power signal from a device and measuring the value on the UUT. This test process can be used by any device that measures absolute DC power.

The process of sourcing a sinusoidal DC Power signal from a device where the Volts and Amps are provided on two different outputs and measured by the UUT as Watts / Power. This test process can be used by any device that measures AC power with separate voltage and current inputs.

This process connects a Termination to the input of a measurement device to reduce the noise and outside electrical signals. The test process is typically used to measure the UUT’s internal noise and offsets. And can be expressed in watts or dBm.

A test process the sources 2 sinusoidal RF signals at different frequencies keeping the power levels constant between the two frequencies. The FrequencyRef signal is sourced and the voltage is measured by the UUT and saved as the Reference value. Then the signal is changed to the test Frequency signal and the test value is measured on the UUT. The two measured values are compared, the results can be expressed as dB or percent of change. These two sinusoidal signals are often used when calibrating bandwidth or frequency response on an Oscilloscope or similar device.

A test process the sources two sinusoidal AC Voltage signals at different frequencies keeping the voltage levels constant between the two frequencies. The FrequencyRef signal is sourced and the voltage is measured by the UUT and saved as the Reference value. Then the signal is changed to the test Frequency signal and the Test value is measured on the UUT. The two measured values are compared, the results can be expressed (e.g.) as a voltage ratio, dB or percent of change. These two sinusoidal signals are often used when calibrating bandwidth or frequency response on an Oscilloscope or similar device.

A test process that sources two sinusoidal AC Voltage signals at different voltage levels keeping the frequency constant. The ReferenceVoltage signal is sourced and the voltage is measured by the UUT and saved as the Reference value. Then the voltage level is changed and the Test value is measured on the UUT. The two measured values are compared, the results can be expressed as (e.g.) as a voltage ratio, dB or percent of change. These two sinusoidal signals are often used when calibrating linearity of a device.

The process of sourcing electrical Resistance of a device either fixed or simulated.

The process of sourcing a sinusoidal AC Voltage signal from a device and measuring the value on the UUT. This test process can be used by any device that measures absolute AC Voltage.

The process of sourcing a DC (Direct Current) voltage from a device and measuring the value on the UUT.

The process of sourcing two DC (Direct Current) voltage signals. First the ReferenceVoltage signal is sourced and measured on the UUT, that value is stored as reference. Then the test Voltage is sourced and measured on the UUT and stored as reading. The test result is returned as (reading – reference). These two voltage signals are often used when calibrating the DC gain of a device such as an oscilloscope.

This process connects a Termination to the input of a measurement device to measure the no signal applied voltage /noise at the inpu. The test process is typically used to measure the UUT’s internal noise and offsets.