voltage

The measurement of the capacitance of a device.

This process measures electric charge sourced in direct-current mode.

The process of measuring the Electrical Conductivity of a Solution or a device.

The process of measuring the frequency of a signal.

The process of measuring an arbitrary Cardiograph waveform frequency.

The process of measuring the impedance of a device.

The process of measuring the Inductance of a device.

A test process that measures the ratio between the AC ripple & noise in RMS voltage measured on a DC signal then divided by the DC voltage level creating a ratio between the two voltages.

A test process that measures the amplitude-response difference between two sinusoidal AC sinewave signals at different frequencies while keeping the source voltage level constant. The two measured values are compared, the results can be expressed as (e.g.) straight ratio, dB or percent of change. These two signals are often used when calibrating flatness of a device.

A test process that measures the difference between sinusoidal AC sinewave signals at different voltage levels keeping the frequency constant. The two measured values are compared, the results can be expressed (e.g.) as a voltage ratio, dB or percent of change. These two signals are often used when calibrating linearity of a device.

The process of measuring the resistance of a resister or other device.

The process of measuring the simulated temperature in voltage from a thermocouple device.

The process measures the AC RMS (Root-Mean-Square) voltage sourced by the UUT. Values can only be expressed in RMS because the shape of the signal is no known.

A test process that measures the RMS AC voltage ripple or noise on a DC signal.

The process measures the AC RMS (Root-Mean-Square) voltage sourced by the UUT. Because the shape is known the values can be converted to Volts PeakToPeak.

The process measures the AC RMS (Root-Mean-Square) voltage sourced by the UUT. Because the shape is known the values can be converted to Volts PeakToPeak.

This test process measures the DC (Direct Current) voltage sourced from the UUT.

UUT is placed in a device, normally a shaker, which then moves in a single axis direction at a known acceleration at the reference frequency. Then the amplitude is changed and the difference in sensitivity is expressed as the slope of the best fit straight line between the data plotted as output (Voltage, IEPE, Current or Charge) vs Test amplitude. Ratio output of linearity expressed as the worst-case voltage difference between the measured value and the best fit straight line divided by the full-scale output (Voltage, IEPE, Current or Charge)*100 (expressed as a percentage).

UUT is placed in a device, normally a shaker, then the shaker moves in a single access direction at a known acceleration and frequency.

This is the process of generating a known capacitance.

Test Process that sources a Force as defined as mass times acceleration (F = m * a). The formula describes a free mass or the net force on any mass. Dead-weight force measurements depend on true mass, specific location’s influences, such as local gravity, air buoyancy, and material density are often needed. Equal but opposite forces counteract to cancel any net motion or acceleration, but result in a deformation of the objects which can be measured. This test process is typically used to calibrate devices like load cells, multi-axis transducers, proving rings, force gauges, traction dynamometers, crane scales, bolt testers, aircraft scales, load cell washer, truck wheel load scales, miniature load cells, handheld force gauges, etc. When sourcing mass of a physical object See Source.Mass.True

The process of generating a frequency-stable sinewave waveform.

The process of generating a frequency-stable square waveform.

The process of sourcing a sinusoidal AC Power signal from a device and measuring the value on the UUT. This test process can be used by any device that measures absolute AC power.

The process of sourcing a sinusoidal AC Power signal from a device where the Volts and Amps are provided on two different outputs and measured by the UUT as Watts / Power. This test process can be used by any device that measures AC power with separate voltage and current inputs.

The process of sourcing DC Power signal from a device and measuring the value on the UUT. This test process can be used by any device that measures absolute DC power.

The process of sourcing a sinusoidal DC Power signal from a device where the Volts and Amps are provided on two different outputs and measured by the UUT as Watts / Power. This test process can be used by any device that measures AC power with separate voltage and current inputs.

UUT is placed in a device, normally a shaker, which then moves in a single axis direction at a known acceleration at the set frequency. Then the amplitude is changed and the difference in sensitivity is expressed as the slope of the best fit straight line between the data plotted as output (Voltage, IEPE, Current or Charge) vs Test amplitude. Ratio output of linearity expressed as the worst case voltage difference between the measured value and the best fit straight line divided by the full scale output (Voltage, IEPE, Current or Charge)*100 (expressed as a percentage).

UUT is placed in a device, normally a shaker, which then moves in a single axis direction at a known acceleration at the reference frequency. Then the frequency is changed to the Test Frequency and difference in sensitivity is expressed as a ratio (Test Frequency / Ref Frequency).

A test process the sources two sinusoidal AC Voltage signals at different frequencies keeping the voltage levels constant between the two frequencies. The FrequencyRef signal is sourced and the voltage is measured by the UUT and saved as the Reference value. Then the signal is changed to the test Frequency signal and the Test value is measured on the UUT. The two measured values are compared, the results can be expressed (e.g.) as a voltage ratio, dB or percent of change. These two sinusoidal signals are often used when calibrating bandwidth or frequency response on an Oscilloscope or similar device.

A test process that sources two sinusoidal AC Voltage signals at different voltage levels keeping the frequency constant. The ReferenceVoltage signal is sourced and the voltage is measured by the UUT and saved as the Reference value. Then the voltage level is changed and the Test value is measured on the UUT. The two measured values are compared, the results can be expressed as (e.g.) as a voltage ratio, dB or percent of change. These two sinusoidal signals are often used when calibrating linearity of a device.

The process of sourcing electrical Resistance of a device either fixed or simulated.

The process of generating a simulated temperature in voltage representing a temperature to be measured by a device.

The process of generating a period-stable pulsed marker waveform.

The process of generating a period-stable square waveform.

The process of sourcing a sinusoidal AC Voltage signal from a device and measuring the value on the UUT. This test process can be used by any device that measures absolute AC Voltage.

The process of sourcing a DC (Direct Current) voltage from a device and measuring the value on the UUT.

The process of sourcing two DC (Direct Current) voltage signals. First the ReferenceVoltage signal is sourced and measured on the UUT, that value is stored as reference. Then the test Voltage is sourced and measured on the UUT and stored as reading. The test result is returned as (reading – reference). These two voltage signals are often used when calibrating the DC gain of a device such as an oscilloscope.

This process connects a Termination to the input of a measurement device to measure the no signal applied voltage /noise at the inpu. The test process is typically used to measure the UUT’s internal noise and offsets.